Who can determine the stress in my thin film deposited on substrate?
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I am a masters in electronic and communications from USA. While conducting thin film deposited on substrate study I found that the stress on my thin film deposited on substrate is very high. However, I did not make any experiments that are necessary. My friend and expert, Dr. Manoj Gupta, a scientist in Mumbai, India, suggested to make an experiment by subjecting thin films to high strain. blog I am not an engineer and cannot make a high stress experiment. He suggested me that I can get it done from my
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When my thin film was deposited on my substrate, I was surprised and impressed. I had never seen such a thin, smooth surface before. But then, I discovered that my thin film had a considerable stress on my substrate. Can you describe the stress that my thin film is subject to, in your own words? First, I must explain a bit about what is a thin film. A thin film is a thin layer of material, usually a solid, that is deposited on another material, also solid. Thin films can have any shape or form, depending
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“The thin film deposited on substrate is stress-induced material with highly crystalline structure and microcavity. Therefore, it presents high mechanical and dielectric properties. Stress level on thin film can be determined by a number of methods, including the method of temperature dependent thermodynamic analysis, by the method of acoustic emission (AE), by the method of dynamic mechanical analysis (DMA), by the method of X-ray diffraction (XRD), and so on. This paper focuses on the dynamic mechanical analysis (DMA)